Principle

Type

Description

Range

DAC-Measurement
double air cushion
- patented -

For double-sided, non-contact measurement. The measurement head and the reference plate glide on an air cushion in a constant separation distance. On both sides, even amounts of aerodynamic pressure are present which avoid contact to the web.

12S: 200µm - 32 mm
14S: 200µm - 34 mm
16U: 200µm - 36 mm
15U: 500µm - 30 mm

UDM-Sensor
(ultrasonic distance measurement)

This sensor was specifically developed to measure thick materials. The measurement is carried out via two ultrasonic sensors on both sides of the material; the distance from the material to the two sensors (without contact) are measured with an accuracy of 01 mm. The total distance between the sensors minus the measuring distance give the result of the material thickness. The zero profile of the frame are compensated via a pickup sensor.

120 - 200 mm
1(others on request)

TOM Sensor
Laser Triangulation

If the material is suitable, it is possible to conduct measurements via ultrasonic sensor and laser triangulation. The distance between the two sensors are determined via a combined inductive pick-up.
 

10,5 - 200 mm
(depending on Frame)

LSM Sensor
Laser Scan Micrometer

Non-contact measurement via laser shadowing via a measuring roll.

0,3mm - 4mm

USM Sensor
Ultrasonic Measurement
- patented -

New measuring process for the determination of grammage and/or thickness on thin materials (patented).
All materials such as fibrous web, paper, synthetics as well as conductive materials such as aluminum, coatings, gold, etc., can be measured without contact and with traversing. With the least possible thickness, an accuracy of 20 nm is reached. Because the sensors are small, we have developed a light-weight frame for this system (aluminum) for a measuring width of up to 10 m.

10,0 g/m - 500 g/m
1(0 µm - 500 µm)

CBM
calliper bearing

Contact measurement via measurement roll and roll (direct measurement). As Labprofiler or as a Sensor in a C-Frame.

12µm - 3mm

MM2
Jockeyroller
-patent pending-

Contact measurement by means of flesible measuring rolls against an aluminum roller or plate. Especially suitable for traversing measurement. (Non-contact principle of measurement due to eddy sensor).

50µm - 5 mm

CDS
Capacitive Displacement Sensor

The measurement is carried out through capacitative basis. The electrical field of the film is influenced, depending on thickness. The contact area of the sensor touches the material without causing damage.

10 - 300 µm

WIF
White Light Interferometer

The interference spektra of thin, transparent and semi-transparent materials are measured and analysed. The interference of both rays are the measurement for the coating thickness of the material.

10,1 - 150µm

OSS4
Optical Surface Scanner

CCD camera for determining surface structures and distance to the material. One or two-dimensional CCD lines, depending on the application.

Surface Defects

CLM
Color Measurement

Online 3-Range-Colour Measurement. Visualisation via SPCwin.

Colour Density

Die Profiler
Profile Projector
-patented-

The thickness profile is projected directly onto the web or die by means of a laser beam, ensuring an exact classification and quick manual adjustment of the thickness distribution. The tiresome counting or searching of die bolts is not necessary.

Projector or Die Control