Icon thickness measurement - MeSys GmbH

Thickness measurement


Due to very accurate on-line thickness measurement gauges (patented technologies) and high performance control algorithms for automatic regulation of productions developed in partnership with the biggest world-wide producers, Mesys on-line thickness gauges are a big step forward in the quality of production assuring the following benefits: 

  • Improve product quality
  • Safe non radiation technology
  • Shorten start-up time
  • Maximize product yield
  • Minimize production costs
  • Optimize the process
  • Reduce downtime
  • Save on raw materials
  • Reduced energy costs

DAC


Pictogram MeSys Sensor DAC

Aircushion / Eddy Current
non-contact,
non-radiation,
0,2 – 30 mm

For two sided contactless measurement. The measuring head and the reference plate float on an insulating air cushion in constant distance to the measuring material. The arrangement is executed in such a way so that the same low aerodynamic power can be carried out on both sides without touching the continuous material.

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LSS2


Pictogram MeSys Sensor LSS2

Laser Shadow
non-contact,
non-radiation,
0,5 – 5 mm

The thickness of web will be calculated by the difference of distance from eddy current sensor to the roller and the web surface measured by the CCD camera from laser scan micrometer.

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MM2


Pictogram MeSys Sensor MM2

Jockeyroller
contact,
no marks,
0 – 4 mm

Contact measurement by means of flexible measuring rolls against an aluminium roller or plate. Especially suitable for traversing measurement. (Non- Contact principle of measurement due to eddy current sensor)

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TOM


Pictogram MeSys Sensor TOM

Laser Triangulation
non-contact,
non-radiation,
0,5 – 200 mm

If the surface finish of the measuring material is suitable, one can measure with laser triangulation. The distance between both sensors is fixed by a combined inductive sensor or adjusted by an zero cross profile.

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USMX


Pictogram MeSys Sensor USMX
USMX / UDM

USMX-200, USMX-500
Ultrasonic Distance Measurement
non-contact,
non-radiation,
0 – 200 µm

New measuring method to determine basis weight and/or thickness of thin material (patented). Therefore all materials like fleece, paper, plastic and also electrically conductive materials like aluminium, coated, gold, etc. can be measured traversing and without contact. With the smallest thickness a precision of 20 nm is reached. Due to the small sensor technology a light- measuring frame made of aluminium profiles for a scan width up to 10m was constructed for this system. (Specs. see data sheet)

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